CA-CX40M metallurgical microscope
Click to enlarge
CA-AWL046-068 wafer inspection system
CA-AWL046-068 晶圆检测系统 | 西岸光电
Back to products
CA-ICX41M inverted metallurgical microscope
CA-ICX41M 倒置金相显微镜 | 西岸光电

CA-CX40M 金相显微镜

The CA-CX40M is a metallurgical microscope for metallographic analysis and industrial inspection. It supports brightfield, oblique-light and simple polarized observation. The reflected-light illuminator includes field and aperture diaphragms; available frame configurations accommodate different specimen heights.

分类：
描述

Overview

The CA-CX40M metallurgical microscope supports metallographic analysis and industrial inspection using reflected-light illumination. Documented observation methods include brightfield, oblique-light and simple polarized observation. The reflected-light illuminator includes both field and aperture diaphragms, and available frame configurations accommodate different specimen heights. Review these frame and optical options against the intended samples when specifying a system. The product image below contains the model information for assessing the observation setup and the required specimen clearance.

  • Reflected-light illumination for metallurgical observation.
  • Brightfield, oblique-light and simple polarization methods.
  • Field and aperture diaphragms in the illuminator.
  • Frame configurations for different specimen heights.

For wafer and flat-panel display inspection, also review the CA-MX4R metallurgical microscope.

CA-CX40M metallurgical microscope features and specifications

相关产品

CA-MX4R metallurgical microscope for wafer and display inspection

CA-MX4R 金相显微镜

The CA-MX4R is a metallurgical microscope for industrial inspection of wafers and flat-panel displays. It combines a large-travel specimen stage with long-working-distance metallurgical objectives. Available observation configurations include reflected brightfield, oblique illumination, polarization and differential interference contrast.

CA-ICX41M inverted metallurgical microscope

CA-ICX41M 倒置金相显微镜 | 西岸光电

The CA-ICX41M is an inverted metallurgical microscope for materials research and inspection. Depending on the selected accessories, it supports brightfield, darkfield, polarization and differential interference contrast observation. Review the product configuration table to select the required optical components.

CA-IE500M series metallurgical microscope

CA-IE500M 系列金相显微镜

The CA-IE500M series is a metallurgical microscope for materials teaching and routine laboratory observation. It supports brightfield and polarized observation with coarse and fine focusing and a mechanical specimen stage. A trinocular imaging interface allows a compatible camera system to be added for demonstrations, image capture and analysis.