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Panjabi 冶金显微镜
Metallurgical microscopes for materials observation, metallographic analysis and wafer inspection. Compare upright and inverted instruments, illumination modes, stages and optical configurations.
CA-CX40M 金相显微镜
The CA-CX40M is a metallurgical microscope for metallographic analysis and industrial inspection. It supports brightfield, oblique-light and simple polarized observation. The reflected-light illuminator includes field and aperture diaphragms; available frame configurations accommodate different specimen heights.
CA-ICX41M 倒置金相显微镜 | 西岸光电
The CA-ICX41M is an inverted metallurgical microscope for materials research and inspection. Depending on the selected accessories, it supports brightfield, darkfield, polarization and differential interference contrast observation. Review the product configuration table to select the required optical components.
CA-IE500M 系列金相显微镜
The CA-IE500M series is a metallurgical microscope for materials teaching and routine laboratory observation. It supports brightfield and polarized observation with coarse and fine focusing and a mechanical specimen stage. A trinocular imaging interface allows a compatible camera system to be added for demonstrations, image capture and analysis.
CA-MX4R 金相显微镜
The CA-MX4R is a metallurgical microscope for industrial inspection of wafers and flat-panel displays. It combines a large-travel specimen stage with long-working-distance metallurgical objectives. Available observation configurations include reflected brightfield, oblique illumination, polarization and differential interference contrast.