CA-CX40M Metallurgical Microscope

Overview

The CA-CX40M metallurgical microscope supports metallographic analysis and industrial inspection using reflected-light illumination. Documented observation methods include brightfield, oblique-light and simple polarized observation. The reflected-light illuminator includes both field and aperture diaphragms, and available frame configurations accommodate different specimen heights. Review these frame and optical options against the intended samples when specifying a system. The product image below contains the model information for assessing the observation setup and the required specimen clearance.

• Reflected-light illumination for metallurgical observation.
• Brightfield, oblique-light and simple polarization methods.
• Field and aperture diaphragms in the illuminator.
• Frame configurations for different specimen heights.

For wafer and flat-panel display inspection, also review the CA-MX4R metallurgical microscope.