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Panjabi D'Inspection Et De Mesure Du Microscope
Microscopy systems for industrial sample inspection and measurement. Explore digital imaging, extended depth of field, image stitching and model-specific 2D/3D measurement functions.
CA-MS Series Non-Contact XYZ Measuring Microscopes
This microscope system offers a precise focus indicator consisting of an index graticule (Target Mark) and a beam-splitting prism built into the reflecting illumination optical system of the microscope. And it has been designed based on the optical principle that at just focus status, of which the upper and lower halves coincide, can be observed above the focused image of a specimen, and that when defocused even slightly, the index line is split into two lines in the upper and lower halves of the graticule.